The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Sep. 07, 2012
Takahiko Hariyama, Shizuoka, JP;
Yasuharu Takaku, Shizuoka, JP;
Hiroshi Suzuki, Shizuoka, JP;
Yoshinori Muranaka, Shizuoka, JP;
Isao Ohta, Shizuoka, JP;
Masatsugu Shimomura, Miyagi, JP;
Daisuke Ishii, Aichi, JP;
Takahiko Hariyama, Shizuoka, JP;
Yasuharu Takaku, Shizuoka, JP;
Hiroshi Suzuki, Shizuoka, JP;
Yoshinori Muranaka, Shizuoka, JP;
Isao Ohta, Shizuoka, JP;
Masatsugu Shimomura, Miyagi, JP;
Daisuke Ishii, Aichi, JP;
JAPAN SCIENCE AND TECHNOLOGY AGENCY, Saitama, JP;
Abstract
Provided is an observation method by an electron microscope, in which a biological sample can be observed as it is alive and a situation that the biological sample is moving can be observed using an electron microscope, and a composition for evaporation suppression under vacuum, a scanning electron microscope, and a transmission electron microscope used in the method. The sample observation method by an electron microscope according to the invention includes applying a composition for evaporation suppression containing at least one kind selected from an amphiphilic compound, oils and fats, and an ionic liquid to the surface of a sample to form a thin film, and covering the sample with the thin film, and displaying an electron microscopic image of the sample, which is covered with the thin film and accommodated in a sample chamber under vacuum, on a display device.