The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Dec. 03, 2010
Applicants:

Jianfeng Chen, Pearland, TX (US);

Xudong Yang, Katy, TX (US);

Brian L. Thigpen, Houston, TX (US);

Brooks A. Childers, Christianburg, VA (US);

Inventors:

Jianfeng Chen, Pearland, TX (US);

Xudong Yang, Katy, TX (US);

Brian L. Thigpen, Houston, TX (US);

Brooks A. Childers, Christianburg, VA (US);

Assignee:

BAKER HUGHES INCORPORATED, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/00 (2006.01); G01L 5/00 (2006.01); G01L 25/00 (2006.01); G01L 1/24 (2006.01); E21B 47/00 (2012.01); G01D 5/353 (2006.01); G01B 11/16 (2006.01); E21B 47/12 (2012.01);
U.S. Cl.
CPC ...
G01L 25/00 (2013.01); E21B 47/0006 (2013.01); E21B 47/123 (2013.01); G01B 11/165 (2013.01); G01D 5/35316 (2013.01); G01L 1/24 (2013.01); G01L 1/246 (2013.01); G01L 5/0047 (2013.01);
Abstract

A method, apparatus and computer-readable medium for determining a strain component for a deformation mode of a member is disclosed. A plurality of measurements is obtained, wherein each of the plurality of measurements relates to a strain at a location of the member. A deformation mode is selected and an adjustable filter is applied to the plurality of strain measurements to determine the strain component for the selected deformation mode.


Find Patent Forward Citations

Loading…