The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Aug. 26, 2013
Osaka University, Osaka, JP;
Takeshi Yasui, Tokushima, JP;
Mamoru Hashimoto, Osaka, JP;
Tsutomu Araki, Osaka, JP;
Yuki Iyonaga, Osaka, JP;
Osaka Univeristy, Osaka, JP;
Abstract
Provided is a Fourier transform spectroscopy method that removes restrictions on spectral resolution and spectral accuracy in Fourier transform spectroscopy for observing a cyclic repeating phenomenon, that realizes, theoretically, infinitesimal spectral resolution accuracy. After accurately and sufficiently stabilizing the repetition period of a phenomenon, a temporal waveform is acquired by making a repetition period and a time width for observing the temporal waveform of a phenomenon strictly conform, and by performing a Fourier transform, acquired is a discrete separation spectrum in which the inverse number of the observation time window size T is made a frequency data gap. Measurement is repeated while causing the repetition period to change, and the gap of the discrete separation spectrum is supplemented. Thereby, in a case of an observation target in which the existence time of a phenomenon is longer than the repetition period, the spectral resolution of the obtained discrete separation spectrum becomes infinitesimal.