The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Oct. 21, 2014
Applicant:

Hand Held Products, Inc., Fort Mill, SC (US);

Inventors:

Serge Thuries, Saint Jean, FR;

Alain Gillet, Toulouse, FR;

Franck Laffargue, Toulouse, FR;

Assignee:

Hand Held Products, Inc., Fort Mill, SC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/00 (2006.01); G01B 11/25 (2006.01); G01B 11/255 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/00 (2013.01); G01B 11/2408 (2013.01); G01B 11/2513 (2013.01); G01B 11/2518 (2013.01); G01B 11/25 (2013.01); G01B 11/255 (2013.01);
Abstract

A system and method for measuring an item's dimensions using a time-of-flight dimensioning system is disclosed. The system and method mitigate multipath distortion and improve the accuracy of the measurements, especially in a mobile environment. To mitigate the multipath distortion, an imager captures an image of an item of interest. This image is processed to determine an illumination region corresponding item-of-interest's size, shape, and position. Using this information, an adjustable aperture's size, shape, and position are controlled so the light beam used in the time-of-flight analysis substantially illuminates the illumination region without first being reflected.


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