The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Nov. 30, 2011
Byeong-sook Bae, Seoul, KR;
Jong-cheol Ghim, Seoul, KR;
Young-hun Hwang, Seoul, KR;
KT Corporation, Seongnam, KR;
Abstract
Method and apparatus for measuring sizes of objects by using photograph. Method includes taking photograph by using camera; recognizing reference scale in photograph and measuring size of reference scale; measuring vertical direction angle and horizontal direction angle between the camera and the objects by using image properties of the recognized reference scale; recognizing the objects in the photograph and measuring vertical sizes and horizontal sizes of the objects; and acquiring actual vertical sizes and actual horizontal sizes of the objects by compensating the measured vertical size and the measured horizontal size of the objects based on the size of the reference scale, the actual size of the reference scale, and the vertical and horizontal direction angles. Therefore, heights and widths of objects distributed throughout a wide area may be precisely measured regardless of positions of the objects by using a reference scale for comparatively measuring sizes of the objects.