The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2017

Filed:

Aug. 20, 2009
Applicant:

Donald R. Sandell, San Jose, CA (US);

Inventor:

Donald R. Sandell, San Jose, CA (US);

Assignee:

Applied Biosystems, LLC, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/38 (2006.01); B01L 3/00 (2006.01); B01L 7/00 (2006.01); B01F 13/00 (2006.01); B01F 15/02 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
B01L 3/502715 (2013.01); B01F 13/0059 (2013.01); B01F 15/0201 (2013.01); B01F 15/0233 (2013.01); B01L 3/5025 (2013.01); B01L 3/50273 (2013.01); B01L 3/502707 (2013.01); B01L 3/502738 (2013.01); B01L 7/52 (2013.01); G01N 35/025 (2013.01); B01L 2200/0642 (2013.01); B01L 2300/0803 (2013.01); B01L 2400/0409 (2013.01);
Abstract

A rotatable sample disk configured for samples of biological material. The sample disk may include a fill chamber for storing a first biological material, a plurality of first sample chambers positioned in the sample disk farther from the rotational axis of the sample disk than the fill chamber, a plurality of second sample chambers, and a plurality of circumferential fill channels. Each of the second sample chambers may be configured to permit fluid communication with a respective first sample chamber. The plurality of circumferential fill conduits may be configured to permit transfer of the first biological material from the fill chamber to the plurality of first sample chambers upon a first rotation of the sample disk about the rotational axis. Methods of loading a plurality of sample chambers in a sample disk are also provided.


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