The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2017
Filed:
Sep. 03, 2014
Yiannis Kyriakou, Spardorf, DE;
Yiannis Kyriakou, Spardorf, DE;
Siemens Aktiengesellschaft, München, DE;
Abstract
Streak artifacts generated by at least one X-ray attenuating object arranged outside a reconstruction volume in a three-dimensional image data set showing the reconstruction volume are reduced. The reconstruction volume is reconstructed from two-dimensional projection images recorded from different projection directions. The object is localized in the projection images showing the object. To determine corrected projection images for the reconstruction of the image data set, the image data of the area of each projection image showing the object is corrected to remove the object. The localization of the object is performed taking into account difference images of the measured projection images and from a reconstruction data set of forward-projected comparative images reconstructed from the measured projection images.