The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2017
Filed:
Jul. 16, 2014
Raytheon Company, Waltham, MA (US);
David Brent Wilson, Santa Barbara, CA (US);
Lee M. Savage, Santa Barbara, CA (US);
Loyra G. Dirzo, Oxnard, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
A method and system for detecting and characterizing an input signal receive a signal having an in-phase (I) component and a quadrature-phase (Q) component. A first IQ sample of the signal is acquired at a first point in time, and a second IQ sample of the signal is acquired at a second point in time, Using one or more processors, a delayed complex conjugate multiply (DCM) is applied to the first IQ sample of the signal and the second IQ sample of the signal to produce a constant product having an in-phase (I) component and a quadrature-phase (Q) component. A signal magnitude and a signal frequency are determined from the Icomponent of the constant and the Qcomponent of the constant, using the one or more processors.