The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2017

Filed:

Jun. 26, 2014
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;

Inventors:

Xuecheng Hou, Beijing, CN;

Tao Wu, Beijing, CN;

Jian Guo, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/786 (2006.01); H01L 21/308 (2006.01); H01L 21/3213 (2006.01); H01L 29/66 (2006.01); H01L 27/12 (2006.01); H01L 29/417 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66765 (2013.01); H01L 21/3081 (2013.01); H01L 21/3083 (2013.01); H01L 21/32139 (2013.01); H01L 27/1288 (2013.01); H01L 29/41733 (2013.01); H01L 29/66969 (2013.01); H01L 29/7869 (2013.01); H01L 29/78669 (2013.01); H01L 29/78678 (2013.01);
Abstract

A manufacturing method of a thin film transistor and a thin film transistor are provided. In the manufacturing method, formation of pattern of a source electrode (), a drain electrode () and an active layer () comprises: forming a semiconductor layer () and a conductive layer () that cover the whole substrate on the substrate in sequence; forming a first photoresist layer () at a region where the source electrode is to be formed and at a region where the drain electrode is to be formed on the conductive layer (), respectively; forming a second photoresist layer () at least at a gap between the source electrode and the drain electrode that are to be formed on the conductive layer (); conducting an etching process on the substrate with the first photoresist layer (), the second photoresist layer (), the semiconductor layer () and the conductive layer () formed thereon, so as to form pattern of the active layer (), the source electrode () and the drain electrode ().


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