The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2017

Filed:

May. 31, 2013
Applicant:

Samsung Sds Co., Ltd., Seoul, KR;

Inventors:

Jun Hee Heu, Seoul, KR;

Jeong Seon Yi, Yongin-si, KR;

Yong Wook Jeong, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06T 7/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/004 (2013.01); G06T 7/2033 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/20016 (2013.01);
Abstract

An apparatus and method for tracking an object using a feature descriptor and an apparatus and method for removing a garbage feature are disclosed. A feature descriptor generation unit generates a plurality of features descriptors indicating information of a plurality of features extracted from an input image from which an object of interest is desired to be detected. A matching unit matches the feature descriptors with feature descriptors of a target object stored in advance, and determines the feature descriptors of the object of interest corresponding to the target object. A feature point removal unit removes feature descriptors that do not meet a geometric comparison condition from among the feature descriptors of the object of interest, and establishes final feature descriptors of the object of interest.


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