The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2017
Filed:
Nov. 30, 2012
Canon Kabushiki Kaisha, Tokyo, JP;
Peter Alleine Fletcher, Rozelle, AU;
Eric Wai-Shing Chong, Carlingford, AU;
Matthew Raphael Arnison, Umina Beach, AU;
Yoichi Kazama, St Leonards, AU;
Allen Peter Courtney, Mooney Mooney, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Disclosed is method of measuring the displacement between a reference region of a reference image and a sample region of a sample image. The method spatially varies the reference region using a one-dimensional filter having complex kernel values, wherein a length (radius) and direction (angle or tangent segment) of the filter is a function of position in the reference region. The method then measures a displacement between the reference region and the sample region by comparing the spatially varied reference region and the sample region.