The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2017

Filed:

Dec. 02, 2014
Applicant:

Raytheon Corporation, Waltham, MA (US);

Inventors:

Timothy Campbell, El Segundo, CA (US);

David S. Douglas, El Segundo, CA (US);

Ryan Quiller, El Segundo, CA (US);

Gregory O. Gheen, El Segundo, CA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 99/00 (2010.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06N 5/025 (2013.01);
Abstract

A method for target identification includes receiving, at one or more processors, a number of measurements of a target, each measurement from the number of measurements being observed at a predetermined time (z), a number of target types (T), each one of the number of measurements, each one the number of target type and each one of one or more hidden states, each hidden state (x) being characterized at the predetermined time, being correlated to one another, providing, using the one or more processors, a first conditional probability distribution, a conditional probability of a target type given a number of measurements, defined inductively, and obtaining an estimate of the target type from the first conditional probability. Systems that implement the method are also disclosed.


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