The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2017
Filed:
Mar. 11, 2014
Samsung Display Co. Ltd., Yongin, KR;
Yong Jun Jang, Yongin-si, KR;
Nam Gon Choi, Yongin-si, KR;
Joon Chul Goh, Hwaseong-si, KR;
Gi Geun Kim, Seoul, KR;
Geun Jeong Park, Daegu, KR;
Cheol Woo Park, Suwon-si, KR;
Yun Ki Baek, Suwon-si, KR;
Jeong Hun So, Hwaseong-si, KR;
Dong Gyu Lee, Seoul, KR;
SAMSUNG DISPLAY CO. LTD., Yongin, KR;
Abstract
An apparatus for detecting an afterimage candidate region includes: a comparison unit which compares gradation data of an n-th frame with integrated gradation data of an (n−1)-th frame and generates integrated gradation data of the n-th frame, where n is a natural number; a memory which provides the integrated gradation data of the (n−1)-th frame to the comparison unit and stores the integrated gradation data of the n-th frame; and an afterimage candidate region detection unit which detects an afterimage candidate region based on the integrated gradation data of the n-th frame, where each of the integrated gradation data of the n-th frame and the integrated gradation data of the (n−1)-th frame comprises a comparison region and a gradation region.