The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2017

Filed:

Jul. 17, 2013
Applicant:

Wei Chen, Potomac, MD (US);

Inventor:

Wei Chen, Potomac, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H03K 17/14 (2006.01); H03K 17/687 (2006.01); H03K 17/693 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0063 (2013.01); H03K 17/145 (2013.01); H03K 17/687 (2013.01); H03K 17/6872 (2013.01); H03K 17/693 (2013.01);
Abstract

A method of image processing. A band-averaged spectral radiance is measured using at least one optical filter upon scanning a plurality of original radiances. The measured band-averaged spectral radiance includes a measured in-band-averaged spectral radiance and a measured band-gap-averaged spectral radiance. A multispectral radiance vector is generated from the measured band-averaged spectral radiance. The multispectral radiance vector and an out-of-band correction transform matrix corresponding to the at least one optical filter are matrix-multiplied to generate a band-averaged spectral radiances image vector representing a plurality of recovered band-averaged spectral radiances. The plurality of recovered band-averaged spectral radiances is analyzed for a presence of a target.


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