The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2017
Filed:
Jan. 16, 2015
International Business Machines Corporation, Armonk, NY (US);
Xiao Yan Chen, Beijing, CN;
Yao Liang Chen, Beijing, CN;
Sheng Huang, Shanghai, CN;
Kai Liu, Beijing, CN;
Chen Wang, Beijing, CN;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method for detecting abnormal subsequences in data sequence includes constructing a hierarchical data structure of a target subsequence, each node in a bottommost layer of the data structure storing corresponding data of the target subsequence, and each node in a layer above the bottommost layer storing values based on data stored in corresponding nodes in a lower layer next to the layer above the bottommost layer; determining a second number of neighbors of the target subsequence based on the data structure of the target subsequence and of the first number of reference subsequences constructed in advance, the second number of neighbors having minimum Euclidean distances from the target subsequence; determining a third number of neighbors of each reference subsequence in the second number of reference subsequences, which have minimum Euclidean distances from each reference subsequence and determining whether the target subsequence is an abnormal subsequence.