The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2017
Filed:
Apr. 27, 2016
Nalux Co., Ltd., Osaka-shi, Osaka, JP;
Tomohito Kuwagaito, Osaka, JP;
NALUX CO., LTD., Osaka-shi, Osaka, JP;
Abstract
In an optical scanning system, each of plural light beams is reflected at a point on a deflector in a sub-scanning cross section, a point of reflection on the deflector of the principal ray of each beam in the case that the principal ray is incident normally to a scanning surface in a main scanning cross section is designated as a fiducial point, distance from the fiducial point to the scanning surface is designated as L, distance from the center of curvature of the exit surface of one of the second scanning lenses for a light beam i to the scanning surface is designated as BFi, refractive powers of the first scanning lens and one of the second scanning lenses are designated as φ1si and φ2si, and then the following expressions are satisfied.0.15≦≦0.2  (1)0.4≦φ1/φ2≦1  (2)