The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2017

Filed:

Feb. 26, 2010
Applicants:

Kevin D. Smith, Glastonbury, CT (US);

Jonathan P. Sullivan, Manchester, CT (US);

David A. Raulerson, Palm Beach Garden, FL (US);

Inventors:

Kevin D. Smith, Glastonbury, CT (US);

Jonathan P. Sullivan, Manchester, CT (US);

David A. Raulerson, Palm Beach Garden, FL (US);

Assignee:

United Technologies Corporation, Hartford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/90 (2006.01); G01B 7/14 (2006.01);
U.S. Cl.
CPC ...
G01N 27/9053 (2013.01); G01B 7/14 (2013.01);
Abstract

An example inspection probe device includes a sensor assembly configured to induce an eddy current in a component. A probe body houses at least a portion of the sensor assembly such that the portion of the sensor assembly is spaced from a target surface of the component when the probe body is in contact with the component. A controller is used to calculate the location of the target surface relative to the probe body using an eddy current parameter sensed by the sensor assembly.


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