The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2017
Filed:
Jul. 10, 2012
Kenji Ikushima, Tokyo, JP;
Kenji Ikushima, Tokyo, JP;
TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY, Tokyo, JP;
Abstract
[Problem to be Solved] To provide a property measuring device for measuring a measurement object, which can highly reliably extract an electric signal serving as the measurement object from an electromagnetic field noise or the like generated by an acoustic wave generating source even if the acoustic wave is a continuous wave, while a high spatial resolution is maintained, by using an acoustic wave as a properly measuring means for measuring an object and method thereof. [Means for Solving the Problem] A property measuring devicefor measuring a measurement object of the present invention includes: an acoustic wave emitting portionarranged away from a measurement objectand emitting an amplitude-modulated acoustic wave; a receiverfor receiving an electromagnetic field generated when the acoustic wave is emitted to the measurement object; and a measuring portionfor extracting at least one type of properties selected from a group consisting of an electric property, a magnetic property, an electromechanical property, and a magnetomechanical property of the measurement object, based on at least one measurement selected from a group consisting of measurements of a strength, a phase, and a frequency of the electromagnetic field.