The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2017
Filed:
Jul. 18, 2013
Msc & Sgcc, Vourles, FR;
Olivier Colle, Oullins, FR;
Florence Drouet, Bures sur Yvette, FR;
Marc Leconte, Loire sur Rhone, FR;
MSC & SGCC, Vourles, FR;
Abstract
An in-line method for optically inspecting transparent or translucent containers () comprises illuminating each container with a light source that presents light intensity variation in a periodic pattern along at least a first variation direction. A number N greater than or equal to three of images of the container traveling in front of the light source and occupying N different respective positions along the travel path is taken. Between taking successive images, a relative shift between the container and the periodic pattern is created. A geometrical transformation is determined and applied in order to put the pixels belonging to the container in the N successive images of the same container into coincidence. A phase image for each container is constructed using the N registered images of the container. The phase image is analyzed in order to deduce therefrom at least the presence of defects or the quality of the container.