The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2017

Filed:

May. 16, 2014
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Goro Fujita, Kanagawa, JP;

Masaaki Hara, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/30 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01);
Abstract

There is provided a laser scanning microscope system including a mode-locked laser unit configured to radiate a laser beam with a predetermined frequency, an intermittent light-emitting unit configured to intermittently emit the laser beam radiated from the mode-locked laser unit in a predetermined intermittent light-emission period, a detector configured to convert a fluorescent substance into an electric signal, the fluorescent substance receiving the intermittently emitted laser beam and then being excited from an object, and an A/D conversion unit configured to sample the electric signal in a sampling period synchronized with the intermittent light-emission period.


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