The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2017
Filed:
May. 22, 2013
Max-planck-gesellschaft Zur Foerderung Der Wissenschaften E.v., Munich, DE;
Deutsches Krebsforschungszentrum, Heidelberg, DE;
Stefan W. Hell, Goettingen, DE;
Johann Engelhardt, Bad Schoenborn, DE;
Matthias Reuss, Sundbyberg, SE;
Volker Westphal, Hannover, DE;
Christian Eggeling, Goettingen, DE;
Gael Moneron, Paris, FR;
Kyu-Young Han, Urbana, IL (US);
Giuseppe Vicidomini, Genoa, IT;
Katrin Willig, Goettingen, DE;
MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN E.V., Munich, DE;
DEUTSCHES KREBSFORSCHUNGSZENTRUM, Heidelberg, DE;
Abstract
In a STED fluorescence light microscope pulses of excitation light () are applied to a sample, which excite fluorescent entities contained in the sample for fluorescence, and which are focused on at least one focal area. Further, de-excitation light () is applied to the sample, which de-excites the excited fluorescent entities and which comprises an intensity zero point in the at least one focal area, as a continuous wave. Fluorescence light emitted by the excited fluorescent entities in the sample is registered after each pulse of the excitation light () and overlapping with applying the de-excitation light () with high temporal resolution between consecutive pulses of the excitation light ().