The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2017

Filed:

May. 09, 2012
Applicants:

Prabhjot Singh, Guilderland, NY (US);

Guanghua Wang, Clifton Park, NY (US);

Mark Allen Cheverton, Mechanicville, NY (US);

Jeffrey Joseph Popielarczyk, Clifton Park, NY (US);

Joseph John Shiang, Niskayuna, NY (US);

Inventors:

Prabhjot Singh, Guilderland, NY (US);

Guanghua Wang, Clifton Park, NY (US);

Mark Allen Cheverton, Mechanicville, NY (US);

Jeffrey Joseph Popielarczyk, Clifton Park, NY (US);

Joseph John Shiang, Niskayuna, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G01K 11/20 (2006.01); G01B 11/16 (2006.01); F01D 17/02 (2006.01); G01K 13/02 (2006.01); G01L 23/16 (2006.01); G01D 5/34 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01K 11/20 (2013.01); F01D 17/02 (2013.01); G01B 11/165 (2013.01); G01D 5/34 (2013.01); G01K 13/02 (2013.01); G01L 23/16 (2013.01); G06T 7/001 (2013.01); F05D 2260/80 (2013.01); G01K 2013/024 (2013.01); G06T 2207/30164 (2013.01); Y02T 50/671 (2013.01); Y10T 29/49117 (2015.01); Y10T 29/49124 (2015.01); Y10T 29/49336 (2015.01); Y10T 29/49769 (2015.01);
Abstract

A system and method for monitoring system including a embedded sensor coupled to an article, wherein the embedded sensor is a direct write embedded sensor using a high temperature light emitting material. A camera system detects illumination signals from the embedded sensors. A processing section processes the illumination signals and determines gas/surface temperatures and strain data for the article.


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