The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2017

Filed:

Mar. 15, 2013
Applicant:

Fluke Corporation, Everett, WA (US);

Inventors:

David Lawrence Epperson, Everett, WA (US);

Glen Howard Vetter, Stanwood, WA (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G01D 5/39 (2006.01); G01D 9/00 (2006.01); G01D 21/00 (2006.01);
U.S. Cl.
CPC ...
G01D 5/39 (2013.01); G01D 9/00 (2013.01); G01D 21/00 (2013.01);
Abstract

In at least one embodiment, a mobile measurement system includes a handheld device, a measurement device, and an optical sensing device. The measurement device and the optical sensing device are communicatively coupled to the handheld device. The handheld device receives measurement data that comprises at least one measured electrical parameter corresponding to a physical property of an external system. The measurement device generates measurement data that corresponds to a period of time. The measurement device communicates the generated measurement data to the handheld device. The optical sensing device generates optical data corresponding to an interface of the measurement device and the external system where the measurement data is being generated. The generated optical data corresponds to a particular time within the measurement period of time. The mobile measurement system associates and stores the generated optical data for the particular time with measurement data corresponding to the period of time.


Find Patent Forward Citations

Epperson, David. (2017). Measurement system with image capture capabilities (U.S. Patent No. 9551597). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9551597

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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