The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2017
Filed:
Sep. 17, 2014
Applicant:
Dmetrix, Inc., Tucson, AZ (US);
Inventors:
Assignee:
DMetrix, Inc., Tucson, AZ (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 9/47 (2006.01); G01B 11/14 (2006.01); G02B 21/26 (2006.01); G02B 21/24 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); G02B 21/241 (2013.01); G02B 21/26 (2013.01); G02B 21/002 (2013.01); G02B 21/367 (2013.01);
Abstract
A method for operating a scanning microscope system. The optimal number of required through-focus scans, that is required to predict the position of a focal plane of the objective with respect to the object to produce the image with minimized blur, is not pre-determined but rather defined iteratively in real-time, contemporaneously with conducting the sample scanning operation itself.