The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2017
Filed:
Aug. 26, 2015
Fuji Xerox Co., Ltd., Tokyo, JP;
Masami Furuya, Kanagawa, JP;
Takeshi Zengo, Kanagawa, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
In the case where, by driving nozzles, test images are formed on paper so that the area of a width predetermined from an end portion in an intersecting direction that intersects with a transporting direction of the paper of a reading area of image reading units is not included in the test images, and the nozzles in an abnormal state are detected by using reading data obtained by reading by the image reading units, the application scope of the reading data applied for detection of an abnormal state is determined so that reading data of each of the test images formed by the nozzles as a detection target of an abnormal state is not repeatedly included with regard to each nozzle, and the nozzles in an abnormal state are detected by using the reading data in the determined application scope.