The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2017

Filed:

Jun. 15, 2010
Applicants:

Timothy J. Pommer, St. Paul, MN (US);

David W. Polly, Jr., Edina, MN (US);

David J. Nuckley, Minneapolis, MN (US);

Evan M. Gustafson, Golden Valley, MN (US);

Charles Gerald Tan Ledonio, Minneapolis, MN (US);

Arthur G. Erdman, New Brighton, MN (US);

Inventors:

Timothy J. Pommer, St. Paul, MN (US);

David W. Polly, Jr., Edina, MN (US);

David J. Nuckley, Minneapolis, MN (US);

Evan M. Gustafson, Golden Valley, MN (US);

Charles Gerald Tan Ledonio, Minneapolis, MN (US);

Arthur G. Erdman, New Brighton, MN (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01); A61B 5/117 (2016.01); A61B 17/16 (2006.01); A61B 5/00 (2006.01); A61B 17/00 (2006.01);
U.S. Cl.
CPC ...
A61B 17/1671 (2013.01); A61B 5/6843 (2013.01); A61B 5/6848 (2013.01); A61B 5/6849 (2013.01); A61B 17/1626 (2013.01); A61B 5/407 (2013.01); A61B 2017/00022 (2013.01); A61B 2017/00221 (2013.01); A61B 2562/0247 (2013.01); A61B 2562/043 (2013.01); A61B 2562/046 (2013.01);
Abstract

A spinal probe comprises a handle, a shaft coupled to the handle and a force sensor to detect forces applied to a tip of the shaft. A controller that executes a predictive algorithm to predict whether or not the tip of the shaft is going to breach a cortex of a pedicle based on the detected forces. The controller may be embedded within the spinal probe or external within a computer or other device coupled to the probe by a data acquisition component.


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