The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

Mar. 03, 2014
Applicant:

Kaneka Corporation, Osaka-shi, Osaka, JP;

Inventors:

Tooru Irie, Settsu, JP;

Takahisa Fujimoto, Settsu, JP;

Takashi Kuchiyama, Settsu, JP;

Hironori Hayakawa, Otsu, JP;

Shinya Omoto, Settsu, JP;

Kenji Yamamoto, Settsu, JP;

Assignee:

KANEKA CORPORATION, Osaka-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 1/09 (2006.01); H05K 1/02 (2006.01); G06F 3/044 (2006.01); H05K 1/03 (2006.01); H05K 3/00 (2006.01); H05K 3/06 (2006.01); H05K 3/22 (2006.01);
U.S. Cl.
CPC ...
H05K 1/0274 (2013.01); G06F 3/044 (2013.01); H05K 1/0296 (2013.01); H05K 1/0326 (2013.01); H05K 1/09 (2013.01); H05K 3/0064 (2013.01); H05K 3/067 (2013.01); H05K 3/227 (2013.01); G06F 2203/04103 (2013.01); G06F 2203/04112 (2013.01); H05K 2201/0108 (2013.01); H05K 2201/0145 (2013.01);
Abstract

Provided is a transparent conductive film including a transparent electrode layer composed of a patterned thin metal wire on at least one surface of a transparent film substrate. The line width of the wire is 5 μm or less. The wire includes a first metal layer and a second metal layer that is in contact with the first metal layer, in this order from a transparent film substrate side. Both of the first and second metal layers contain copper in an amount of 90% by weight or more. The total film thickness of the first and second metal layers is 150 to 1000 nm. The diffraction angle 2θ of the (111) plane of the second metal layer is less than 43.400° as measured using a CuKα ray as an X-ray source, and the first metal layer has crystal properties different from those of the second metal layer.


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