The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

Apr. 11, 2014
Applicants:

Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd., Shenzhen, CN;

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Chih-Kuang Chang, New Taipei, TW;

Jia-Jia Chen, Shenzhen, CN;

Zhong-Kui Yuan, Shenzhen, CN;

Li Jiang, Shenzhen, CN;

Dong-Hai Li, Shenzhen, CN;

Xiao-Guang Xue, Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23212 (2013.01); G06T 7/0002 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30121 (2013.01);
Abstract

In a focus identification method for identifying different focuses of an object, discrete image data is acquired from captured images of an object. The images are captured by a charge coupled device (CCD) in motion of a measurement machine at a predetermined time period. The discrete image data includes definitions of the images and Z-coordinates of the CCD when capturing the images. Maxima and minima of the discrete image data are computed to establish intervals within the discrete image data. The intervals are selected one by one, and a curve is fitted according to the discrete image data at the selected interval. A peak value of the fitted curve is computed as one of focuses of the object when a goodness of fit of the fitted curve meets a predetermined criterion.


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