The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

Aug. 28, 2015
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Xishe Liu, Shenzhen, CN;

Shijun Wang, Wuhan, CN;

Heyuan Liu, Lagos, NG;

Zhiyong Xiao, Wuhan, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); H04B 10/071 (2013.01); G01M 11/00 (2006.01); H04J 14/02 (2006.01); H04Q 11/00 (2006.01); H04J 14/00 (2006.01); G02B 6/293 (2006.01); G02B 3/04 (2006.01);
U.S. Cl.
CPC ...
H04B 10/071 (2013.01); G01M 11/3136 (2013.01); H04J 14/0227 (2013.01); H04Q 11/0005 (2013.01); H04Q 11/0067 (2013.01); G02B 3/04 (2013.01); G02B 6/29304 (2013.01); H04Q 2011/0016 (2013.01); H04Q 2011/0083 (2013.01);
Abstract

The present invention provides an optical path processing method and apparatus. The apparatus includes an FA, an LA, an aspheric lens, a filter, and a reflector, where the FA includes a test optical channel, where the test optical channel is configured to receive test light, and enable the test light to be incident through the LA and the aspheric lens to a surface of the filter; the filter is located between the aspheric lens and the reflector, and is configured to perform transmission on the test light; and the reflector is at a distance of less than or equal to a first preset value away from a focus of light transmitted through the aspheric lens, and is configured to reflect, at a preset angle, the test light transmitted through the filter to a specular surface of the reflector.


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