The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

Nov. 10, 2015
Applicant:

At&t Intellectual Property I, Lp, Atlanta, GA (US);

Inventors:

Richard Hart, Cameron Park, CA (US);

Xiaochuan Yi, Danville, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2015.01); H04L 25/02 (2006.01); H04L 25/08 (2006.01);
U.S. Cl.
CPC ...
H04B 3/46 (2013.01); H04L 25/0278 (2013.01); H04L 25/08 (2013.01);
Abstract

Systems and methods for detecting and analyzing discontinuities in a communications link are disclosed. In some embodiments, the systems and methods operate to project signals into the communications link and detecting reflected signals. The reflected signals are processed to define a transformed distribution of the reflected signals. A peak value in the transformed distribution is selected and a local fit to the selected peak value is performed using a model function. A residue distribution is formed based upon the transformed distribution and the model function. A location of the discontinuity based upon the residue distribution is identified, and another peak value from the residue distribution is selected. Additional systems and methods are disclosed.


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