The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

May. 23, 2013
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Stephen P. Ayotte, Bristol, VT (US);

Benjamin J. Pierce, Winooski, VT (US);

Timothy M. Sullivan, Essex Junction, VT (US);

Heather M. Truax, Burlington, VT (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); H01L 27/20 (2006.01); G01P 15/08 (2006.01); G01P 15/09 (2006.01);
U.S. Cl.
CPC ...
H01L 23/562 (2013.01); G01P 15/0891 (2013.01); G01P 15/09 (2013.01); H01L 27/20 (2013.01); H01L 2924/0002 (2013.01);
Abstract

An approach for detecting sudden changes in acceleration in a semiconductor device or semiconductor package containing the semiconductor device is disclosed. In one embodiment, a piezoelectric sensor is embedded in a semiconductor die. The piezoelectric sensor is configured to sense a mechanical force applied to the semiconductor die. An excessive force indicator is coupled to the piezoelectric sensor. The excessive force indicator is configured to generate an excessive force indication in response to the piezoelectric sensor sensing that the mechanical force applied to the semiconductor die has exceeded a predetermined threshold indicative of an excessive mechanical force.


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