The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

Oct. 29, 2015
Applicant:

Sandisk Technologies Inc., Plano, TX (US);

Inventors:

Aaron Lee, Milpitas, CA (US);

Mrinal Kochar, Milpitas, CA (US);

Yew Yin Ng, Milpitas, CA (US);

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/06 (2006.01); G11C 11/419 (2006.01); G11C 16/04 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 11/419 (2013.01); G11C 16/0483 (2013.01); G11C 16/3454 (2013.01); G11C 16/3459 (2013.01);
Abstract

Apparatus and method for performing a post-write read in a memory device are disclosed. A memory device may include 3-dimensional memory, with the wordlines in a memory block each having multiple strings. Periodically, the memory device may analyze the wordlines for defects by performing a post-write read on a respective wordline and analyzing the read data to determine whether the respective wordline is defective. Rather than reading all of the strings for the respective wordline, less than all of the strings (such as only one of the strings) for the respective wordline are read. In this way, determining whether the respective wordline in 3-dimensional memory may be performed more quickly.


Find Patent Forward Citations

Loading…