The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

Jun. 25, 2015
Applicant:

Hgst Netherlands B.v., Amsterdam, NL;

Inventors:

Sridhar Chatradhi, San Jose, CA (US);

Martin Aureliano Hassner, Mountain View, CA (US);

Natasa Letourneaut, Rochester, MN (US);

Satoshi Yamamoto, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/455 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G11B 5/455 (2013.01); G06N 7/005 (2013.01);
Abstract

A method, apparatus, and system for implementing head degradation detection and prediction for hard disk drives (HDDs) are provided. Statistical parameter stability tests are used that are calculated as Confidence Intervals (CIs) from HDD parameter measurements. HDD parameters include, for example, change or delta in fly height (dFH), magnetic resistor resistance (MRR) head values, servo variable gain amplifier (SVGA) readback amplitude values, that are used in conjunction with two or more confidence level indicators and an Auto-Regressive Integrated Moving-Average (ARIMA) (p, d, q) predictor for head degradation detection and field failure prediction.


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