The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
May. 27, 2014
Samsung Electronics Co., Ltd., Suwon-si, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Choong-hwan Choi, Suwon-si, KR;
Yong-man Ro, Daejeon, KR;
Seong-ho Chang, Yongin-si, KR;
Woo-sup Han, Yongin-si, KR;
Seong-tae Kim, Daejeon, KR;
Min-cheol Park, Bucheon-si, KR;
Do-kwan Oh, Suwon-si, KR;
Byeong-won Lee, Pyeongtaek-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon-si, KR;
Abstract
A method of and apparatus for changing lesion classification data, the method including determining whether at least one mass is included in an image of an object, determining whether the at least one mass corresponds to a lesion by using first data including at least one first information, selecting a false negative (FN) mass which has been determined as not corresponding to the lesion among the at least one mass, based on a first input, and changing the first data to second data by using second information of the selected FN mass.