The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Feb. 05, 2013
Applicant:
Ip Reservoir, Llc, St. Louis, MO (US);
Inventors:
Ronald S. Indeck, St. Louis, MO (US);
David Mark Indeck, Highlands Ranch, CO (US);
Naveen Singla, St. Louis, MO (US);
Jason R. White, Manchester, MO (US);
Assignee:
IP Reservoir, LLC, St. Louis, MO (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/00 (2006.01); G06F 1/00 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 5/025 (2013.01);
Abstract
Disclosed herein is a method and apparatus for hardware-accelerating various data quality checking operations. Incoming data streams can be processed with respect to a plurality of data quality check operations using offload engines (e.g., reconfigurable logic such as field programmable gate arrays (FPGAs)). Accelerated data quality checking can be highly advantageous for use in connection with Extract, Transfer, and Load (ETL) systems.