The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

Sep. 25, 2012
Applicants:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Industry-academic Cooperation Foundation, Yonsei University, Seoul, KR;

Inventors:

Youn-ho Kim, Hwaseong-si, KR;

Chang-mok Choi, Yongin-si, KR;

Kun-soo Shin, Seongnam-si, KR;

Myoung-ho Lee, Seoul, KR;

Jin-kwon Kim, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01);
Abstract

A method of classifying an input pattern and a pattern classification apparatus are provided. The method includes enabling an artificial neural network to learn based on learning input data received by an input layer of the artificial neural network, determining classification of an input pattern received by the input layer of the enabled artificial neural network according to an output value obtained from an output layer of the artificial neural network, the obtained output value being based on the input pattern, updating connection intensities of a plurality of connection lines of the enabled artificial neural network to output a result value indicating the determined classification from the output layer when the input pattern, and determining updated classification of the input pattern according to an updated output value obtained from an output layer of the updated artificial neural network, the obtained updated output value being based on the input pattern.


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