The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

Aug. 05, 2008
Applicants:

Mazda A. Marvasti, Rancho Santa Margarita, CA (US);

Astghik Grigoryan, Yerevan, AM;

Arnak Poghosyan, Yerevan, AM;

Naira Grigoryan, Yerevan, AM;

Ashot Harutyunyan, Yerevan, AM;

Inventors:

Mazda A. Marvasti, Rancho Santa Margarita, CA (US);

Astghik Grigoryan, Yerevan, AM;

Arnak Poghosyan, Yerevan, AM;

Naira Grigoryan, Yerevan, AM;

Ashot Harutyunyan, Yerevan, AM;

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01); G06Q 40/00 (2012.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30598 (2013.01); G06F 17/30548 (2013.01); G06Q 40/00 (2013.01); H04L 67/22 (2013.01);
Abstract

Cycles and other patterns within time-series data are determined. Time-series data are transformed into discretized sets of clustered data that are organized by time period. Comparison is made of the organized data to determine similar time periods and multiclusters of the similar time periods are formed. From the multicluster data, cycles are identified from which thresholds and other useful data may be derived, or the data used for other useful purposes.


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