The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Nov. 28, 2014
Software Ag, Darmstadt, DE;
Christoph Heinz, Weimar, DE;
Daniel Schaefer, Ober-Moerlen, DE;
Michael Cammert, Wettenberg, DE;
Tobias Riemenschneider, Schwalmstadt, DE;
Juergen Kraemer, Marburg, DE;
Software AG, Darmstadt, DE;
Abstract
Certain example embodiments address issues associated with erroneous events produced in Complex Event Processing (CEP) applications. An error handler is controlled to at least: receive, via an event bus, events from external input event sources; receive, via the event bus, error events from an application configured to process events received from the event bus, and to provide to the event bus results obtained from processing received events, and error events corresponding to errors detected at its input and/or processing layer(s); generate, for a given error, an error analysis event and an error impact event by executing a CEP query on at least a corresponding received error event; and provide to the event bus generated error analysis events and generated error impact events. Error analysis events describe for administrators detailed information analyzing corresponding errors. Error impact events describe for business users impacts corresponding errors have for their business user applications.