The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Oct. 30, 2014
Johannes Scheerer, Heidelberg, DE;
Ralf Schmelter, Wiesloch, DE;
Steffen Schreiber, Frankenthal, DE;
Dietrich Mostowoj, Ludwigshafen am Rhein, DE;
Thomas Klink, Moerlenbach, DE;
Matthias Braun, Illingen, DE;
Johannes Scheerer, Heidelberg, DE;
Ralf Schmelter, Wiesloch, DE;
Steffen Schreiber, Frankenthal, DE;
Dietrich Mostowoj, Ludwigshafen am Rhein, DE;
Thomas Klink, Moerlenbach, DE;
Matthias Braun, Illingen, DE;
SAP SE, Walldorf, DE;
Abstract
A method for profiling an application on a virtual machine is provided. A series of analysis steps to be performed on profiled data can be created. The series of analysis steps can be saved as a report specification. A back-end profiler can then be caused to perform profiling on the application. Profiled data can be received from the back-end profiler. The profiled data can be stored as a model. The model can then be adapted based on the series of analysis steps from the report specification. Output data can be generated based on the adapted model. Finally, the output data is displayed to a user.