The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9547230 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 17, 2017

Filed:

Dec. 16, 2014
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Koji Mikami, Nikko, JP;

Tadashi Arai, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G03F 1/36 (2012.01);
U.S. Cl.
CPC ...
G03F 1/36 (2013.01);
Abstract

A method being performed by a processor includes, acquiring data of patterns of a plurality of cells that include an identified pattern for which an evaluation value of an optical image falls outside a first allowable range among patterns in which each a pattern being single cell alone, creating the pattern of a mask by arranging the patterns of the plurality of cells that include the identified pattern, and evaluating an optical image of the identified pattern in the created pattern of the mask.


Find Patent Forward Citations

Mikami, Koji. (2017). Method for evaluating optical image of pattern, recording medium, and information processing apparatus (U.S. Patent No. 9547230). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9547230

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