The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Nov. 29, 2013
Zhiwen Liu, State College, PA (US);
Chuan Yang, State College, PA (US);
Kebin Shi, Beijing, CN;
Mingda Zhou, State College, PA (US);
Siyang Zheng, State College, PA (US);
Shizhuo Yin, State College, PA (US);
Zhiwen Liu, State College, PA (US);
Chuan Yang, State College, PA (US);
Kebin Shi, Beijing, CN;
Mingda Zhou, State College, PA (US);
Siyang Zheng, State College, PA (US);
Shizhuo Yin, State College, PA (US);
The Penn State Research Foundation, University Park, PA (US);
Abstract
We present a method for parallel axial imaging, or z-microscopy, utilizing an array of tilted micro mirrors arranged along the axial direction. Image signals emitted from different axial positions can be orthogonally reflected by the corresponding micro mirrors and spatially separated for parallel detection, essentially converting the more challenging axial imaging to a lateral imaging problem. Each micro mirror also provides optical sectioning capability due to its finite dimension.