The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

Sep. 27, 2013
Applicants:

David Grodzki, Erlangen, DE;

Patrick Gross, Buckenhof, DE;

Inventors:

David Grodzki, Erlangen, DE;

Patrick Gross, Buckenhof, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/565 (2006.01); G01R 33/24 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56572 (2013.01); G01R 33/24 (2013.01);
Abstract

In a method and magnetic resonance (MR) system for the creation of an artifact-free image data set of an imaging area located in a measurement volume of the MR system, measurement data are acquired from which an image data is to be reconstructed, with gradients for spatially coding of the measurement data are ramped continuously over time to a strength desired for the acquisition of the measurement data, without abrupt changes in the gradient strength. The actual gradients present in the measurement volume are measured by a field mapping device in the measurement volume of the MR system. The trajectories along which k-space is scanned during the acquisition of the measurement data are calculated on the basis of the measured actual gradients. An artifact-free image data set is reconstructed from the acquired measurement data under consideration of the calculated trajectories, and is displayed and/or stored.


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