The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

Apr. 29, 2014
Applicant:

Melexis Technologies NV, Tessenderlo, BE;

Inventors:

Robert Racz, Zug, CH;

Mathieu Ackermann, Lausanne, CH;

Jian Chen, Heist op den Berg, BE;

Assignee:

Melexis Technologies NV, Tessenderlo, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/07 (2006.01); G01R 19/00 (2006.01); G01R 15/20 (2006.01);
U.S. Cl.
CPC ...
G01R 19/0092 (2013.01); G01R 15/20 (2013.01); G01R 33/07 (2013.01); G01R 15/207 (2013.01);
Abstract

A device for current measurement comprises a substrate with a first current conductor and a current sensor with a second current conductor. The current sensor is mounted above the first current conductor on the substrate. The second current conductor is formed with integrally attached first and second terminal leads through which the current to be measured is supplied and discharged. The current sensor further comprises a semiconductor chip with a magnetic field sensor mounted on the second current conductor on the side of the second current conductor facing the substrate. The magnetic field sensor is sensitive to a component of the magnetic field extending parallel to the surface of the semiconductor chip and perpendicular to the second current conductor. The second current conductor extends above and parallel to the first current conductor.


Find Patent Forward Citations

Loading…