The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Jan. 29, 2015
Applicant:
Delbio, Inc., Taoyuan, TW;
Inventors:
Hung-Yun Liao, Taoyuan, TW;
Chih-Wei Weng, Taoyuan, TW;
Tsung-Hsuan Tsai, Taoyuan, TW;
Miao-Ju Yen, Taoyuan, TW;
Assignee:
Delbio, Inc., Taoyuan, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/327 (2006.01);
U.S. Cl.
CPC ...
G01N 27/3274 (2013.01);
Abstract
An examination method for detecting abnormal electrochemical testing strip includes the steps of: applying a trigger voltage to a testing strip; injecting a target sample to the testing strip; obtaining a trigger current which is generated by injecting the target sample to the testing strip; comparing the trigger current with a first threshold, and determining whether the trigger current is lager than or equal to the first threshold; and when the trigger current is less than the first threshold, displaying a message for abnormality.