The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2017

Filed:

Oct. 31, 2012
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Keith Cox, Sunnyvale, CA (US);

Gaurav Kapoor, Santa Clara, CA (US);

Vaughn Arnold, Scotts Valley, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G01K 1/00 (2006.01); G01K 7/42 (2006.01); G06F 1/20 (2006.01); G01K 1/20 (2006.01);
U.S. Cl.
CPC ...
G01K 7/425 (2013.01); G01K 7/42 (2013.01); G06F 1/206 (2013.01); G01K 1/20 (2013.01);
Abstract

Methods and apparatuses are disclosed to estimate temperature at one or more critical points in a data processing system comprising modeling a steady state temperature portion of a thermal model at the one or more critical points using regression analysis; modeling the transient temperature portion of the thermal model at the one or more critical points using a filtering algorithm; and generating a thermal model at the one or more critical points by combining the steady state temperature portion of the thermal model with the transient temperature portion of the thermal model. The thermal model may then be used to estimate an instantaneous temperature at the one or more critical points or to predict a future temperature at the one or more critical points.


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