The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Apr. 18, 2014
Applicant:
Quantum Focus Instruments Corporation, Vista, CA (US);
Inventors:
Assignee:
Quantum Focus Instruments Corporation, Vista, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01R 31/311 (2006.01); G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
G01J 5/0096 (2013.01); G01J 5/025 (2013.01); G01R 31/311 (2013.01); G01J 2005/0077 (2013.01);
Abstract
Dynamic Digital Modulation obtains thermal image data on active semiconductor devices with sufficient sensitivity to be used in situ with packaged devices. These techniques can be applied to dynamic failures, but can also produce quantitative data of actual power dissipation as the device is placed into different operational modes. The thermal image results can be analyzed to assist in thermal management and assessing reliability and failure analysis issues in semiconductor devices.
Falk, R.. (2017). Dynamic differential thermal measurement systems and methods (U.S. Patent No. 9546907). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9546907
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile