The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Jan. 14, 2014
Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, Guangdong, CN;
Ping Luo, Guangdong, CN;
Shenzhen China Star Optoelectronics Technology Co., Ltd, Shenzhen, Guangdong, CN;
Optoelectronics Technology Co., Ltd, Guangdong, CN;
Abstract
The present invention relates to an alignment inspecting system for liquid crystal substrate, comprises an alignment mechanism located on corners of the substrate, and the alignment mechanism including a horizontal alignment device for exerting pressure to edges of the substrate, wherein a flattening device for applying longitudinal pressure to the substrate is further included. The present invention can be concluded with the following advantages: this alignment inspecting system for liquid crystal substrate can be used to correct the bending of the substrate during alignment process, so as to reduce the bending and deformation of the substrate which in turn creates poor contact between the probe and the substrate. As a result, incorrect reading can be avoided.