The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Apr. 18, 2015
Applicant:
Mediatek Singapore Pte. Ltd., Singapore, SG;
Inventors:
Timur Kelin, Cambourne, GB;
Cyril Valadon, Letchworth Garden, GB;
Assignee:
MEDIATEK SINGAPORE PTE. LTD., Singapore, SG;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 11/02 (2006.01); G01B 11/25 (2006.01); G01N 21/956 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01B 11/02 (2013.01); G01B 11/2522 (2013.01); G01N 21/6456 (2013.01); G01N 21/956 (2013.01);
Abstract
Methods and systems for contactless optical measurement of geometrical dimensions of articles are disclosed herein. A system according to the present disclosure may implement an arrangement of one or more measured articles, two imaging setups, a reflecting surface and a reference object. Geometrical dimensions of the one or more measured articles may be derived from dimensions of images formed in the imaging setups.