The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2017
Filed:
Jul. 04, 2013
Essilor International (Compagnie Generale D'optique), Charenton le Pont, FR;
Fabien Divo, Charenton-le-Pont, FR;
Guilhem Escalier, Charenton-le-Pont, FR;
ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE), Charenton-le-Pont, FR;
Abstract
Disclosed is a device for measuring ocular refraction and a geometric-morphological parameter of an individual, including: a gaze-stimulating target placed so as to stimulate the gaze of the individual in a posture associated with a proximity value and a sight axis; an illuminating system able to generate at least one illuminating beam in the direction of the eyes of the individual; an image-capturing system; and a computer able to receive at least one first image captured by the image-capturing system. According to the invention, the image-capturing system is able to acquire an image of part of the face surrounding the eyes of the individual, and the computer is able to extract, from the acquired image, a first measurement of a glazing parameter and a first measurement of objective ocular refraction by refraction of the illuminating beam on the eyes of the individual in the given posture.