The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2017

Filed:

Feb. 19, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

John K. Baker, Taylorsville, UT (US);

Moises I. Galvan, Austin, TX (US);

Yunwu Huang, Chappaqua, NY (US);

Matthew A. Markley, Hays, KS (US);

Amitkumar M. Paradkar, Mohegan Lake, NY (US);

Venkata Vinay Kumar Parisa, Charlotte, NC (US);

Birgit M. Pfitzmann, Valhalla, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 67/1095 (2013.01); H04L 41/08 (2013.01); H04L 41/0823 (2013.01); H04L 67/10 (2013.01);
Abstract

Methods and systems for finding a migration target include building a constrained, layered graph from a catalog of possible configuration combinations and a distance function for each layer in the graph; and determining an available path through the graph, said path having a minimum overall distance from a source instance, by performing an optimized search that selectively evaluates available paths through the graph based on cumulative distances of paths through the graph from the source instance.


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